UV-6020 UV-Vis Spectrophotometer

The UV-6020 is an extended model that balances flexibility and functionality. It features a wide wavelength range of 190 nm to 1200 nm, low stray light levels and low noise specifications, comparable to many high-priced UV-Vis and UV-Vis-NIR instruments. It has continuously variable slit width in the range of 0.5 nm to 3.0 nm. This true dual-beam instrument is well suited for routine laboratory work as well as more advanced applications with wavelength range extending into the NIR region. Various accessories can be used with this model, including sample changers, autosamplers, semiconductor Peltier effect or water-bath temperature controllers, and integrating spheres for reflectance measurement up to 1150 nm. The UV-6020 offers maximum flexibility and extremely powerful functionality.

True dual-beam optical system with excellent long-term stability, ensuring the accuracy of measurement results

    Innovative optical design guarantees reliable and stable measurement results, even for µL-level sample volumes. All performance specifications are met. Tests required by IQ/OQ, multi-national pharmacopoeias and other performance specifications can be easily completed through the "Automatic System Performance Verification" module of the UV software

    Multiple applications are completed through dedicated software modules, such as routine testing, quantitative analysis, system performance verification, color analysis, kinetics/time studies and DNA melting analysis

    Leading design ensures no spectral distortion even at scanning speeds as high as 10,000 nm/min, enabling full-wavelength scanning to be completed in a time two orders of magnitude less than traditional instruments.

    Using a uniquely designed holographic grating, very low stray light levels can be achieved, thereby ensuring excellent photometric accuracy over a wide absorbance range. The UV-6020 can accurately measure samples up to 3 Abs.

    Within one chopper rotation cycle, the detector dark current is measured and corrected twice, eliminating errors caused by dark current drift and improving measurement stability and linearity.