China's National Institute of Metrology Builds First High-Precision Roundness Reference Device, Reducing Uncertainty from 20nm to 6nm

en.Wedoany.com Reported - China's first high-precision roundness reference device has been developed and officially established by the National Institute of Metrology, China.

Roundness is a core fundamental parameter in the geometric dimensioning and tolerancing system. Its measurement accuracy directly affects the performance and assembly quality of high-end manufacturing products such as precision spindles, advanced optical components, and semiconductor chips. For a long time, although China has established geometric measurement standards such as flatness, the roundness value has lacked a national-level traceability source, posing a challenge to the independent control and high-quality development of high-end equipment.

The newly established roundness reference device fills this gap, providing highly reliable and accurate measurement traceability support for strategic industries such as aerospace, high-end machine tools, advanced optics, and semiconductor manufacturing. It enhances the national geometric measurement system and offers fundamental technical assurance for building a manufacturing and quality powerhouse.

On the technical front, the device integrates multiple independent innovations, overcoming international technical bottlenecks such as high-accuracy roundness evaluation, spindle error separation, and filtering consistency control. It introduces a roundness calculation model based on high-accuracy roundness filtering and full data utilization, effectively solving the stability issue of contour reconstruction after standard hemisphere separation.

China's self-developed novel error separation technology significantly suppresses spindle rotation errors, reducing roundness measurement uncertainty from 20 nanometers to 6 nanometers, achieving internationally advanced measurement capabilities. This breakthrough means China has achieved independent control over core key technologies for high-accuracy roundness measurement, breaking the long-standing foreign technological monopoly.