en.Wedoany.com Reported - Mettler-Toledo Product Inspection has launched the X56 DXD+, a dual-energy photon-counting X-ray system integrated with AI capabilities, further expanding the X6 series product line for packaged food applications. The company states that the system is designed to enhance the detection of low-density contaminants such as rubber and plastic in products like pet food, potato chips, and potatoes.
The X6 series now encompasses a full range of X-ray inspection solutions tailored to different product sizes, from individual packages to large cases or multipacks. Based on the X16 and X36.2 systems, the X56 DXD+ offers dual-energy photon-counting capabilities within a 500 mm system width for single-lane medium to large products or smaller packages across multiple lanes.
The system integrates AI to assist with quality inspection tasks, a feature the company says helps reduce unnecessary product rejections and address inspection challenges involving overlapping or mixed products. The AI integration technology can also be applied to other X-ray systems in the Mettler-Toledo product line.
Powered by DXD+ detector technology and Advanced Material Discrimination Pro (AMD Pro) software, the X56 DXD+ is claimed to deliver superior inspection performance in complex applications where traditional single-energy systems may be limited, particularly in detecting low-density contaminants in packaged products with variations in thickness, density, or overlapping textures—such as multipacks, bagged chips, or larger cartons.
Within the X6 series, the X16 is positioned for high-speed inspection of individual packages, while the X36.2 is designed for high-throughput environments and offers multi-lane configurations.
The X56 DXD+ features a tool-free belt removal design for easy cleaning and adheres to hygienic design principles. The company claims it can process up to 500 products per minute. Built-in quality tools include integrity checks, clip detection, and detection of product caught in seals.
The system is compatible with a range of conveyor heights and reject options, and is available in single-lane or multi-lane configurations. It includes a recorded image database accessible directly via the screen or integrated through Mettler-Toledo's ProdX data management software for centralized monitoring. The company states that the software enables automatic real-time monitoring, reporting, and organization of inspection activities, supporting regulatory compliance and audit readiness.
Chris Plant, Market Management Director at Mettler-Toledo Safeline X-ray, said: "The launch of the X56 DXD+ expands our X6 series, offering a comprehensive set of inspection solutions tailored for modern food manufacturing. With its dual-energy photon-counting capability, the X56 DXD+ achieves new levels of inspection performance in complex packaging across single-lane and multi-lane formats. This advanced inspection capability will help customers confidently inspect every product, protecting productivity, brand reputation, and profits, while easily meeting industry requirements."
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