China's CIQTEK Releases 200kV Field Emission Transmission Electron Microscope with Mass Production and Delivery Capability

en.Wedoany.com Reported - On October 18, the 200kV field emission transmission electron microscope TEM-F200, independently developed by CIQTEK Technology (Hefei) Co., Ltd., was officially released at the 2026 National Annual Meeting of Electron Microscopy in Nanjing. The product achieves an information resolution of 0.1 nm and a point resolution of 0.25 nm, with multiple key performance indicators reaching internationally advanced levels, and has attained mass production and delivery capability. This marks a acceleration of domestic high-end transmission electron microscopes from development breakthroughs toward productized delivery.

Transmission electron microscopes are key analytical tools in fields such as semiconductors, advanced materials, new energy, and life sciences. They use high-energy electron beams to penetrate samples and form images by collecting transmitted, scattered, and diffracted electrons, enabling atomic-scale characterization of crystal structures, interfaces, and defects. For a long time, the global transmission electron microscope market has been dominated by a small number of international manufacturers, and domestic users have faced severe external dependence in equipment procurement, key component supply, repair and maintenance, software adaptation, and application services. Achieving domestic production of high-end transmission electron microscopes helps enhance the self-reliance and controllability of the scientific instrument supply chain.

200kV-class field emission transmission electron microscopes impose extremely high requirements on the coordinated stability of multiple systems, including the electron gun, high-voltage power supply, electron optics, detectors, and overall instrument control, and have long represented a technological high ground for international manufacturers. Through independent research and development, the CIQTEK team completed the entire process from core modules, control and analysis software, and system integration to overall optimization.

He Yu, Chairman of CIQTEK, introduced: "The 200kV transmission electron microscope has a higher accelerating voltage, higher electron beam kinetic energy, and shorter wavelength, providing stronger penetration capability for high-density samples within a certain thickness range compared with lower-voltage platforms; when combined with suitably thin samples and corresponding analytical accessories, it can better support high-resolution imaging, interface and defect analysis, and nanoscale micro-area composition analysis in fields such as semiconductors and advanced materials. Its development difficulty lies not simply in increasing the accelerating voltage, but in achieving stable coordination among multiple systems including the high-voltage power supply, electron gun, electron optics, detectors, software, and overall instrument control. After continuous efforts, the TEM-F200 has achieved mass production and delivery capability, and a comprehensive customer service system has been established."

Wu Aihua, Secretary-General of the Analytical Instrument Branch of the China Instrument and Control Society, stated that 200kV transmission electron microscopes can be applied in research and industrial fields such as materials development, chip microstructure and failure analysis, biomedicine, and product quality control. The release of CIQTEK's 200kV field emission transmission electron microscope will further enrich the domestic supply of high-end scientific instruments and enhance the independent support capability of analytical testing technology.