en.Wedoany.com Reported - Keyence has launched the IM-X series dimensional measurement equipment, which integrates the functions of a tool microscope, CNC image measuring instrument, projector, vernier caliper, and contour measuring instrument. It requires no specialized technicians or manual focusing. Simply place the workpiece and press the start button, and dimensional measurement can be completed in as fast as 1 second. AI server manufacturers are accelerating the adoption of this equipment to address dimensional measurement requirements for components such as high-density PCBs, optical module connectors, customized stamping terminals, and micron-level chip substrates. Traditional inspection methods face three major bottlenecks: slow incoming material sampling inspection delays the overall assembly pace; manual judgment introduces errors, leading to misclassification of good products or missed defects; and measurement data is difficult to trace, failing to meet the audit requirements of the AI hardware supply chain.

The IM-X series has been applied in scenarios such as UQD interface dimension inspection, liquid cooling plate flow channel dimension inspection, cooling fin gap inspection, optical module housing external dimension inspection, filter dimension inspection, MT connector dimension inspection, as well as high-speed connector finished product external dimension inspection, PIN position accuracy, and terminal coplanarity inspection.

Feedback from application customers indicates that after adopting the IM-X, the frequency of incoming material inspection has significantly increased, the assembly defect rate has decreased, and new employees at overseas factories can operate independently after just 30 minutes of training. The equipment can cover multiple stages including incoming material inspection, in-process inspection, and pre-shipment inspection.